Lukas Knappstein
Switching Transient Steepness , 2025 IEEE Applied Power Electronics Conference and Exposition (APEC), Atlanta, GA, USA, 2025, pp. 2772-2778, doi: 10.1109/APEC48143.2025.10977545 L. Knappstein , N. Falkenberg [...] Basis einer Gatestrom Messung Mai 2025 Moritz Wilhelm Ernst Gate-Current Based Dead-Time Control in Half-Bridges Utilizing Drain-Gate Feedback from Switch Node August 2025 Publikationen L. Knappstein , N …